A variable gain double loop control scheme is proposed to solve great overshoot and unstable problem of the precise test turntable under great error signal. The position control system is analyzed and designed. 针对精密测试转台位置方式在大偏差下超调量大及条件稳定问题,提出变增益双回路控制方案,对其位置控制系统进行了分析和设计。
When all digital phase-locked loop ( PLL) is applied in OFDM systems, two problems must be solved. The first is how to normalize the error signal, and the second is how to avoid the phenomenon of out-of-lock in multipath fading channel. 将全数字锁相环应用到OFDM系统的定时跟踪中时,有两个重要的问题需要解决,即误差信号归一化的问题和锁相环在多径衰落信道条件下容易失锁的问题。